Fig. 1: Structural analysis of a Co-doped BiFeO3 epitaxial thin film.
From: Superior polarization retention through engineered domain wall pinning
a Surface topography and b in-plane piezoresponse force microscopy (PFM) phase images. The striped in-plane domains with a [110] orientation suggest a monoclinic distortion within the tetragonal matrix. c High-resolution X-ray diffraction θ−2θ scan. d High-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) image of the sample, which shows the distribution of the defects in the film. e A HAADF-STEM image of a single defect with a higher magnification (from a different area as compared with d) shows the local structure of the defective region (denoted by the yellow dashed box).
