Fig. 4: Scanning electron diffraction analysis of surface-guided CsPbBr3 nanowires cross-section.
(a) High magnification image displaying the single-crystal CsPbBr3 lattice. (b) Nanobeam scanning electron diffraction (SED, or 4D-STEM) analysis, a TEM image overlaid with the actual diffraction patterns acquired at every position across the nanowire cross-section. One typical diffraction pattern is enlarged at the inset. For each nanowire cross-section: (c) the in-plane and out-of-plane relative reciprocal-lattice rotation map and (d) relative reciprocal-lattice spacing map. (e) A schematic model that illustrates the real-space distortion of a cubic lattice according to the trends found in the SED analysis for the in-plane direction: Lattice rotation (Δϕ) and dilated spacings near the substrate (Δd). (f) Line profiles along the black and green arrows indicated in (c) of the real-space lattice spacings difference (Δd) and relative lattice rotation (Δϕ). Source data are provided as a Source Data file.
