Fig. 3: Summary of dose dependence of information limit from ADF and electron ptychography. | Nature Communications

Fig. 3: Summary of dose dependence of information limit from ADF and electron ptychography.

From: Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose

Fig. 3

The opened markers are electron ptychographic results using simulated data from references Jiang et al. and Pelz et al. The filled markers are experimental results by electron ptychography from Song et al. and this manuscript. The single-mode and mixed-state results are from Fig. 4 in the main text. Resolution by dose-limit, inversely proportional to square root of dose (linear in log-log plot), and by aperture limit are guided by dashed lines. Information limit for ADF (plus makers) is measured from low-angle ADF images of monolayer WS2 synthesized from in-focused 4D-STEM.

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