Fig. 6: Typical length scales required for patterning organic semiconductors. | Nature Communications

Fig. 6: Typical length scales required for patterning organic semiconductors.

From: Rapid and high-resolution patterning of microstructure and composition in organic semiconductors using ‘molecular gates’

Fig. 6

The characteristic dimensions are shown for metamaterials, photonic structures, displays, organic field-effect transistors (OFETs), organic photovoltaics (OPV), RFID tags, security features and organic thermoelectric generators (OTEGs). Pattern resolutions obtained in the present work are indicated by solid black bars, with broken bars showing their plausible extensions.

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