Fig. 2: HKUST-1 synthesis, characterization, and thermal conductivity measurements.

a (i) The HKUST-1 single crystal was glued onto a silicon carrier wafer. (ii) Part of the area was blocked with a strip of Kapton tape. (iii) After sputtering Pt and Au, the tape was removed. (iv) The FDTR lasers were focused on the crystal for thermal conductivity measurements. b HKUST-1 SURMOF thin films were prepared by (i) coating an Au or Al surface on a silica substrate with a self-assembled monolayer (SAM) and then (ii and iii) alternately dipping samples in solutions containing either the metal or ligand precursors to grow HKUST-1 epitaxially in layers, followed by (iv) thermal conductivity measurements via TDTR. c Optical images of HKUST-1 single crystal before and after soaking in water. d HR-SEM image of an HKUST-1 SURMOF film. e Simulated and measured PXRD spectra of pristine HKUST-1 bulk crystals and SURMOF films on Au/silica and Al/silica surfaces.