Fig. 1: X-ray diffraction and x-ray spectroscopies of Ag-Pd thin films.
From: Tuning the electronic structure of Ag-Pd alloys to enhance performance for alkaline oxygen reduction
a Grazing incidence x-ray diffractograms highlighting the (111) fcc peak as a function of Ag:Pd ratio in Ag1-xPdx films. Ag (38.30°) and Pd (40.35°) (111) peak locations are indicated with dotted lines. (See expanded 2θ range in Supplementary Fig. 1a, and symmetric-geometry diffractograms in Supplementary Fig. 2). b Vegard’s Law analysis of the (111) peak showing Pd content in the alloy versus nominal Pd composition. High resolution c Ag 3d and d Pd 3d XPS spectra as a function of Ag:Pd ratio in Ag1–xPdx films (see survey spectra and XPS compositional analysis in Supplementary Figs. 3 and 4). e Normalized Pd L3 x-ray absorption near-edge region spectra (Pd L3-edge XANES) for select Ag1–xPdx compositions (x = 1, 0.9, 0.8, 0.5, 0.2), and f FEFF simulated Pd L3-edge XANES for select Ag1-xPdx compositions (x = 1, 0.9, 0.8, 0.5, 0.2). (See full XANES scan in Supplementary Fig. 5). All samples measured on standard glass slides for GI-XRD and on glassy carbon substrates for XPS and XANES. The colors refer to the nominal Pd loading, consistent with the text labels in the figure.
