Fig. 2: STEM analysis of the hexagonal 1T-CrTe2 sample.

a Low-magnification STEM-HAADF image. b Atomic-resolution STEM-HAADF image and c the corresponding FFT pattern. d Atomic-resolution STEM-HAADF image of the cross-sectional specimen, showing an obvious layered structure. Insets in b, d: the corresponding crystal structures, with Cr in maroon and Te in yellow. e STEM-EELS elemental mapping of Cr. f The overlaid image of Cr-EELS map (in green) on HAADF image (in red).