Fig. 6: Absolute value of the transfer function of a HRFZ-Si wafer, recorded in reflection geometry with a focused THz beam. | Nature Communications

Fig. 6: Absolute value of the transfer function of a HRFZ-Si wafer, recorded in reflection geometry with a focused THz beam.

From: Optoelectronic frequency-modulated continuous-wave terahertz spectroscopy with 4 THz bandwidth

Fig. 6: Absolute value of the transfer function of a HRFZ-Si wafer, recorded in reflection geometry with a focused THz beam.The alternative text for this image may have been generated using AI.

The acquisition of 1000 averages leads to a total measurement time of 15 s. The THz path was purged with nitrogen gas to avoid water vapor absorption. The full THz spectrum (a) and a magnification of a single Fabry–Pérot dip around 1.03 THz (b) are shown.

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