Fig. 8: Reflection measurement data and model of a three-layer sample. | Nature Communications

Fig. 8: Reflection measurement data and model of a three-layer sample.

From: Optoelectronic frequency-modulated continuous-wave terahertz spectroscopy with 4 THz bandwidth

Fig. 8: Reflection measurement data and model of a three-layer sample.The alternative text for this image may have been generated using AI.

a Processed time-of-flight signal (blue) and model function (orange) of a three-layer sample. The tree layers are indicated by the areas shaded in green and gray. b The samples outer shape resembles a traditional Berlin traffic light figure. c The three-layer samples inner structure: green paint on the front side, a ceramic substrate, and another green paint layer on the backside. Note that the model function reproduces the individual peaks of the data trace accurately. A sketch of the sample and its cross-section showing the layer stack are depicted on the right.

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