Fig. 1: Basic material properties and schematic set-up.
From: All-optical switching of an epsilon-near-zero plasmon resonance in indium tin oxide
a Schematic pump–probe set-up with the ITO sample index matched to a prism in order to probe the ENZ plasmon beyond the critical angle (here, θ = θpr = 45°). In this geometry, the relative beam angles are fixed such that the pump angle is always given as θpm = θpr − 3.4°. b Optical permittivity of the ITO film used in this study, measured using ellipsometry, with an epsilon-near-zero frequency of 243 THz (red dashed). c Plasmon dispersion branch of the 60-nm ITO thin film closest to the air light line (blue), calculated following Supplementary Note S3.
