Table 1 Growth conditions studied.
From: In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
Growth condition index | TEGa flow (μmol min−1) | H2 frac. in carrier (%) | Net growth rate G (monolayer s−1) |  | Measured values from CTR fits | Best fit from BCF model |
|---|---|---|---|---|---|---|
1 | 0.000 | 50 | −0.0018 | \({f}_{{\rm{\alpha }}}^{{\rm{ss}}}\) |    0.111 ± 0.013 | 0.136 |
2 | 0.000 | 0 |    0.0000 | \({f}_{{\rm{\alpha }}}^{{\rm{ss}}}\) |  0.461 ± 0.018 | 0.440 |
3 | 0.033 | 50 |    0.0109 | \({f}_{{\rm{\alpha }}}^{{\rm{ss}}}\) |   0.811 ± 0.014 | 0.836 |
4 | 0.033 | 0 |    0.0127 | \({f}_{{\rm{\alpha }}}^{{\rm{ss}}}\) | 0.868 ± 0.011 | 0.847 |
1–2 |  |  |  | trel |  2200 ± 200 s | 2478 |
2–4 |  |  |  | trel |    340 ± 30 s | 331 |
