Fig. 1: Microstructure and composition characterization.

a An optical micrograph of the fabricated 70 μm × 5 μm Hall bar. b The high resolution cross-section transmission electron microscopy image of the CoPt alloy single-layer film with the nominal multilayered structure of Pt(0.7)/Co(0.3)/Pt(0.5)/Co(0.5)/Pt(0.3)/Co(1), which is grownn on Ru/Si buffer/substrates and capped by MgO protective layer. c the enlarged high-angle annular dark-field (HAADF) images, d the elemental mapping, e the HAADF images of the Ru(2)/IrMn(8)/Co(2)/Ru(0.8)/CoPt(3.3)/MgO(2) heterojunction. Inset of e shows the line scanning of the EDS results marked by a white arrow in d. It is clear that the designed nominal multilayered structure of Pt(0.7)/Co(0.3)/Pt(0.5)/Co(0.5)/Pt(0.3)/Co(1) has formed the single-layer CoPt alloy with an artificial composition gradient in the thickness direction. In contrast, the Ru(2)/IrMn(8)/Co(2)/Ru(0.8)/CoPt(3.3)/MgO(2) heterojunction still keeps a good multilayered structure.