Fig. 5: Micromagnetic simulations of skyrmion size effects.
From: Visualizing the strongly reshaped skyrmion Hall effect in multilayer wire devices
a, b Representative micromagnetic magnetization of a 2 × 4 μm2 wire showing a single skyrmion formed upon relaxation at μ0H ≃ 85 mT. The grain-free simulations were performed using stack parameters consistent with experiments (details in Methods). c, d Evolution of micromagnetic simulated average velocity \(\langle {v}_{{\rm{S}}}^{{\rm{m}}}\rangle\) (c) and average angular deflection \(\langle {\theta }_{{\rm{S}}}^{{\rm{m}}}\rangle\) (d) with dS — extracted from a series of such simulations at a representative J = 9.5 × 1011 A/m2. Solid lines represent sigmoidal (c) and linear (d) fits, respectively.
