Fig. 1: Structure and defect analysis of YFO thin films on NSTO substrate.
From: An antisite defect mechanism for room temperature ferroelectricity in orthoferrites
a, b Structural characterization of the as-grown YFO/NSTO by high-resolution XRD (a) and asymmetric RSM (b). The subscript p denotes the pseudocubic unit cell. c Schematic of lattice structures of YFO and NSTO viewed along the orthorhombic [110] axis (pseudocubic [100] axis) of the YFeO3 unit cell. d High-resolution Fe 2p and Y 3d core level spectra of the stoichiometric YFO target and the as-prepared YFO film. e HAADF STEM image and denoised atomic resolution STEM EDS elemental mapping. The intensity profile superposed in the HAADF STEM image is taken along the blue line. Fe–O atom columns rich in YFe defects show increased intensity in HAADF (red arrow) and a signal in the Y map (white arrows).
