Fig. 3: Simultaneous elimination of the reflection and refraction effects on a dielectric surface by the GAM.

a, b Simulated \({E}_{z}\) field distributions for a dielectric surface without (a) and with (b) the designed GAM under illumination of a TE-polarized wave with the incident angle of \(45^\circ\). c Simulated far-field radiation power pattern in the half-infinite space of dielectric material. d Schematic diagram of the experimental setup. e, f Experimentally measured \({E}_{z}\) field distributions for the dielectric surface without (e) and with (f) the GAM in the regions marked by the dotted box shown in (a) and (b), respectively.