Fig. 1: STEM images for the formation of homologous shear faults.

Each image was acquired in a SrTiO3, b BaCeO3, c LaCoO3, d LaNiO3, and e CsPbBr3. The yellow broken lines in each image indicate the fault planes consisting of two consecutive [AX] sublayers, as schematically described in a together with an annular bright-field image. The atomic-scale chemical map shown in b was obtained by using EELS to verify the consecutive [BaO] sublayers.