Fig. 3: Time-resolved photoluminescence (TRPL), pump-probe spectra, and photoluminescence propagation (diffusion) of treated MoS2 monolayers.

a TRPL decay curves for H-TFSI-treated and Li-TFSI-treated monolayer MoS2. The fitting is presented in black solid lines. b Pump-probe data of H-TFSI-treated MoS2 where features related to traps can be seen at 730 nm. c Pump-probe data of Li-TFSI-treated MoS2 which show no trap-related features at 730 nm. d Spatial profile of the normalized PL intensity IPL for time snapshots t = 0 and 0.35 ns for H-TFSI-treated monolayer MoS2. IRF refers to the instrument response function. Distance x refers to the distance from excitation. e Spatial profile of the normalized PL intensity IPL for time snapshot t = 0, 0.55 and 3 ns for Li-TFSI-treated monolayer MoS2. f Variance σt2 as a function of time extracted from the Gaussian PL diffusion profiles of Li-TFSI-treated and H-TFSI-treated MoS2 samples. The diffusion coefficient (D) is obtained from fits to the diffusion plots.