Fig. 4: Micromagnetic simulations.
From: Defect-driven antiferromagnetic domain walls in CuMnAs films
a–d Micromagnetic simulations of the AF domain structure in areas with different microtwin patterns (indicated by the broken yellow lines). a, b Feature parallel microtwins 2 domain wall widths apart (a) and two 7 domain wall widths apart (b). c, d The simulation results for different initial conditions for the same microtwin pattern of one perpendicular and two parallel microtwins forming two T-junctions. The green arrows (in a–d) and color wheel show the local orientation of the Néel vector. e–g XMLD-PEEM images of AF domains overlaid with the microtwin pattern measured in XLD-PEEM (yellow broken lines).
