Fig. 3: Perovskite microcells with reduced interfacial defects.
From: Perovskite microcells fabricated using swelling-induced crack propagation for colored solar windows
a Cross-sectional illustrations of the fabrication process of perovskite microcells. b, c Schematic illustrations of the charge-carrier dynamics in the perovskite microcell with the simultaneous lift-off structure (b) and the conventional structure (c). d Current–voltage (I–V) characteristics of the ETL/perovskite layer with the simultaneous lift-off structure (red) and the conventional structure (blue) in the dark condition. Pointed values and arrows indicate threshold voltages and scan directions, respectively. e Cross-sectional SEM image of a perovskite microcell. f, g Magnified view of Fig. 3e at the center (f) and at the edge (g). h Current density–voltage (J–V) characteristics of three types of patterned devices under the forward and reverse scan. i Stabilized power output of perovskite microcells. j PCEs (reverse scan) depending on the number of perovskite microcells in the PV. k Statistical data on the PCE of 25 PVs (reverse scan).
