Fig. 3: Multiferroic properties of an ETO:MgO VAN film.

a Temperature and (b) magnetic field-dependent magnetization measured by applying a magnetic field along the IP direction. The inset of (b) shows the comparison of magnetic hysteresis loops measured by applying a magnetic field along the IP (blue) and OOP (black) directions. c Ferroelectric polarization hysteresis loop and switching current measured by PUND and at 1 kHz. d Capacitance–voltage curve measured at 100 K. The inset shows the temperature-dependent dielectric constant showing a FE TC of ∼255 K.