Fig. 2: Microstructure characterization of the 90° twisted BFO lateral homostructure.
From: Twisted oxide lateral homostructures with conjunction tunability
a Typical cross-sectional TEM image taken along [001] direction of STO substrate. The insets show the corresponding SAED patterns of STO substrate, BFO grown on pristine STO (BFOAG), and BFO grown on FS-STO (BFOFS), respectively, in which the scale bar refers to 2 nm−1. b, c HRTEM images of the interface area taken along the [001] and [\(1\bar{1}0\)] direction of STO substrate, respectively. d HAADF image of the interface area observed along the [001] direction of STO substrate. A gap between FS-STO and STO can be clearly seen, where the space was further filled with BFO. e Typical HAADF image of the BFOFS/BFOAG interface. f, g Enlarged atomic images from the green and red rectangles in (e). h O-K and (i) Fe-L2,3 edges acquired from the region 1, 2, and 3 in (e).
