Fig. 3: Mechanism of the wrinkling phenomena on RP-T50 film. | Nature Communications

Fig. 3: Mechanism of the wrinkling phenomena on RP-T50 film.

From: Integrating charge mobility, stability and stretchability within conjugated polymer films for stretchable multifunctional sensors

Fig. 3

a Optical microscopic images of RP-T50 films coated on a PDMS substrate before (as-cast) and after annealing at various temperatures. b Proposed mechanism of spontaneous formation of wrinkled structure in a RP-T50 film upon thermal annealing. c SEM image of the surface of the RP–T50–COOH film (annealed at 150 °C) on PDMS. Inset: the magnified image of the wrinkled surface with a cross-sectional view. d SEM images of RP–T50–COOH films with three different thicknesses. As the thickness of the film increases, the wavelength of wrinkles is enhanced. e Plot of the wavelength of wrinkles in RP–T50–COOH films as a function of film thickness. The thicknesses were measured after annealing RP-T50 films at 150 °C for 12 h. Error bars represent mean ± s.d., with n = 3.

Back to article page