Fig. 3: CTM angular measurements.
Measured capacitance change as a function of angle in various applied fields for an HTO single crystal, measured at T = 0.5 K. a CTM response when B rotates in the (001) plane (the [100] direction corresponds to 0∘). b CTM response when B rotates in the (1\(\bar{1}\)0) plane (the [\(11\bar{2}\)] direction corresponds to 0∘). c, d CTM response in a 6 T applied field for the (001) plane and the (1\(\bar{1}\)0) plane, respectively. The 6 T data (solid black line) was scaled according to sample volume and cantilever sensitivity. The data are plotted alongside calculated torque curves using the phenomenological model described in the Methods section and Supplementary Notes 1, 2. The solid colored model curves correspond to stable phases, while the dotted lines are calculated using volume fractions of spin flips on the α and β sublattices. For each panel, crystallographic directions are indicated by vertical dashed lines.
