Fig. 3: Geochemistry of the sintered veneers.
From: In-conduit capture of sub-micron volcanic ash particles via turbophoresis and sintering
a, b Energy-dispersive X-ray spectroscopy (EDX) element maps of sample CCTVAIP, with Si, O, and additional elements overlain on an SEM image. c As (a), for sample CCVP. d Point EDX analyses for sample CCVP, with spectra for points s1–s4 (the substrate) shown in e, and points s5–s10 (discrete particles) in f. Peaks for C, O, Na, Al, Si, and K are highlighted. Note white box showing area of Fig. 2m. g As (d), for sample CCTVAIP. Spectra for points s11–s14 are shown in h.
