Fig. 2: Interface structure of Al/Si Sample 1 and Sample 2.
From: Inelastic phonon transport across atomically sharp metal/semiconductor interfaces
Cross-sectional TEM image of Al(111)/Si(111) Sample 1 (a) and Sample 2 (b). Scale bars are 2.5 nm.
Fig. 2: Interface structure of Al/Si Sample 1 and Sample 2. | Nature Communications
