Fig. 2: Structural and material characterizations of MoS2 pattern. | Nature Communications

Fig. 2: Structural and material characterizations of MoS2 pattern.

From: Transition metal dichalcogenide metaphotonic and self-coupled polaritonic platform grown by chemical vapor deposition

Fig. 2

a Cross-sectional low magnification view (left 1) of scanning transmission electron microscopy (STEM) micrograph of the MoS2 grating for elemental mapping. Corresponding energy dispersive X-ray spectroscopy (EDS) maps of the MoS2 cross-section show the spatial distributions of elements Si, O, Pt, Mo, S, and overlay separately. b High-resolution transmission electron microscopy (HRTEM) graphs of the top boundary (green box), internal part (yellow box), and bottom boundary (magenta box) of the MoS2 bar. c Schematic of the transferring procedure of MoS2 metastructure from SiO2 (2 μm)/Si substrate to glass substrate. d Raman spectra measured from the top (red curve) and the bottom (blue curve) sides of the MoS2 structures. The black curve represents the Raman spectrum from Mo patterns. e The real (blue solid curve) and imaginary (red dashed-dotted curve) parts of the dielectric function of multilayer MoS2 after sulfidation. Red and green areas are used to differentiate region I (400 nm to 750 nm) and region II (>750 nm) of the complex refractive index (i.e., \(n+i\kappa\)) of bulk MoS2.

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