Fig. 2: Combined effects of genetic variations and root-associated microbiota on agronomic traits of foxtail millet.

A–F The variation of growth (TSLW, MSW, MSPD) and yield (MSPW, PGW, MSPL) traits explained by the genetic SNPs and microbial OTUs combined. Each panel shows observed values on the x-axis and model-predicted values on the y axis, with a fitted linear regression. Specifically, the predicted value of TSLW, MSW, MSPD, MSPW, PGW, and MSPL is calculated based on 136, 100, 117, 126, 110 and 106 samples in the testing dataset, respectively. The dark trend line illustrates the predicted effect in the linear model (LM). The gray shading around the line represents a confidence interval of 0.95. TSLW, top second leaf width; MSW, main stem width; MSPD, panicle diameter of the main stem; MSPW, main stem panicle weight; PGW, per plant grain weight; MSPL, panicle length of the main stem.