Fig. 9: Dependence of ultrafast carrier dynamics on defects.
From: Optoelectronic properties and ultrafast carrier dynamics of copper iodide thin films
a TA spectra of CuI thin films with different treatments (Fp = 2.54 mJ/cm2, λp = 320 nm). b Normalized PB dynamics probed at the 406 nm, with the lines the corresponding fits.
