Fig. 3: In-situ total internal reflection imaging method to characterize electrode stability. | Nature Communications

Fig. 3: In-situ total internal reflection imaging method to characterize electrode stability.

From: Dual interfacial engineering of a Chevrel phase electrode material for stable hydrogen evolution at 2500 mA cm−2

Fig. 3

a Schematic of the macroscopic contact among the red light, prism and electrode. The incident red light is at the TIR angle. b The new-born microscopic interfaces between the electrode, H2 bubbles, and electrolyte during HER. The evanescent layer is about 637 nm. c The relationships between incident angle, equivalent refractive index and reflectivity. d The relationships between onset potential of electrode and light intensity. e, f Difference value mappings of the onset potential of Pt/C and CuMo6S8/Cu electrode before and after 10,000 CV cycles.

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