Fig. 3: In situ STEM observation of NP formation by exsolution of Ni in the non-stoichiometric LSNT film.

a Cross-sectional STEM-HAADF image and b the corresponding Ni EDS map of non-stoichiometric 60 nm thick film after heating inside STEM. Magnified STEM-HAADF images c before and d after in situ heating. e Ni EDS map of d showing the preferential formation of Ni NPs at APBs. APBs are outlined by white dashed lines. The inset in c represents the simulated APB model in good agreement with the experimental image. The complicated STEM-HAADF image contrast originates from the overlap of APD and matrix along the viewing direction. The in situ heating was performed at 700 °C for 45 min in the high vacuum (~10−7 Torr) of TEM column. f Schematic illustrating the preferential formation of Ni NPs near the APBs as observed by in situ STEM heating. Considering the size of APDs (2~5 nm in width), most of them are embedded within the TEM specimen (~20 nm in thickness).