Fig. 7: Electrical properties as a function of structure.
From: Priming self-assembly pathways by stacking block copolymers
a Top-down SEM and b SEM cross-sections of electrical devices fabricated on the L75/C67 bilayer configuration annealed for \({t}_{{{{{{\rm{anneal}}}}}}}=1200\) s at 250 \(^\circ {{{{{\rm{C}}}}}}\). c The electrical resistivity of metal oxide nanostructures fabricated from BCP bilayers are compared to those from the blend (error bars are standard deviation from multiple replica samples). Material layering, as well as BCP annealing, greatly influence the morphology, and thereby the resultant electrical connectivity after conversion into an inorganic replica.
