Fig. 2: STED-ISM principle.
From: Focus image scanning microscopy for sharp and gentle super-resolved microscopy
In (a), we show simulated images of the PSF h(xs∣xd) for each detector element. In (b), we show the shift vectors, calculated using the adaptive pixel reassignment algorithm, and the fingerprint, calculated by summing all the xs points of the above images. In c, we compare the PSF obtained with a single-element detector (open pinhole configuration) with the PSF reconstructed with the ISM method. The upper diagonal is normalized to itself, and the lower diagonal is normalized to the maximum of the corresponding ISM reconstruction. The numerical value is the FWHM resolution of the PSF. Each result is shown for increasing saturation factor (ς), from left to right.
