Fig. 4: Depth sectioning via multislice ptychography and focal series iCOM. | Nature Communications

Fig. 4: Depth sectioning via multislice ptychography and focal series iCOM.

From: Sub-nanometer-scale mapping of crystal orientation and depth-dependent structure of dislocation cores in SrTiO3

Fig. 4

a Depth sections of multislice ptychography and iCOM. From top to bottom, sections at 1, 4 and 11 nm in depth. Scale bars, 5 Å. b Cross-sections in potential and phase images along the pathway (dashed line in a) linking the atomic column in the upper (U) and lower (L) sections. From left to right are the potential used to generate the simulation dataset, phase images recovered from multislice ptychography and focal series iCOM. c Phase profiles of the U and L sections of the atomic column shown in b. The vertical lines indicate the turning points along the atomic column. The smearing effect in depth is larger for iCOM than for ptychography.

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