Fig. 4: Indentation punching test of a DPP-3F-COF free-standing film by AFM peak force QNM technology.
From: A self-standing three-dimensional covalent organic framework film
A step-increasing force was applied on the tip (radius lower than 12 nm) from 4 nN to 16 nN. The AFM height image is shown as a and the corresponding adhesion image is shown as b. Puncture was caused under a force of 16 nN.
