Fig. 1: A catalog of defects in 2D smectics.
a Single defects marked on a high resolution photo of a fingerprint. +1/2 disclination, −1/2 disclination and edge dislocation marked by red cross, yellow trilateral and red circle, respectively. b Schematics of (left) +1/2 disclination, (center) −1/2 disclination and (right) dislocations. c–k Simulations of defects for model parameters A = − 1 (lamellar state), C = 2 and κ2 = 0.75 in circular domains with boundary conditions requiring single defects. Columns present three defect types: (first column) + 1/2 disclination; (second) − 1/2 disclination; (third) edge dislocation. Rows show plots of: c–e layer visualization \({{{{{{{\rm{Re}}}}}}}}\left[{{\Psi }}\right]\); f–h modulus \(\left|\psi \right|\) with N overlaid; i–k phase ϕ with N.
