Fig. 4: Structural characterization of Nd4Ni3O10/LaAlO3 (001) (ϵ = − 0.9%).
From: Limits to the strain engineering of layered square-planar nickelate thin films
a XRD scan of a Nd4Ni3O10/LaAlO3 film. The asterisks denote substrate peaks and the vertical lines mark the 00l peak positions of bulk Nd4Ni3O1095. b Schematic crystal structure of well-ordered, horizontal Ruddlesden–Popper layers. c MAADF-STEM image of the Nd4Ni3O10/LaAlO3 film shown in (a). d Atomic-resolution HAADF-STEM image showing the representative lattice structure of the film with an atomic model overlay of the structure shown in (b), boxed in yellow.
