Fig. 2: Physical characterization.

a, b TEM, c HR-TEM, and d AFM images of InOOH-OV. e SAED pattern of of InOOH-OV. Atomic-resolution HAADF-STEM images of f typical intact InOOH nanosheets and g InOOH-OV. h HAADF-STEM image within an individual InOOH-OV sheet and i comparison of O K-edge EELS spectra between domain A and domain B. j XRD patterns of InOOH-O2, InOOH, and InOOH-OV samples. The corresponding HR-XPS spectra of k In 3d and l O 1 s. m The EPR spectroscopies.