Fig. 2: Partial quenching of defect emitters in locally strained 1L WSe2.
From: Chemomechanical modification of quantum emission in monolayer WSe2
a Height image from atomic force microscopy (AFM) of a 1L WSe2 flake. The region marked with the orange square is relatively flat, whereas the region inside the green circle contains wrinkles with localized strain. b, c Low-temperature (T = 1.7 K) photoluminescence (PL) spectra of 1L WSe2 at (b) the flat region and (c) the wrinkle, before (blue) and after (red) 4-nitrobenzenediazonium (4-NBD) treatment. The spectra were measured with ~60 µW excitation power. d High-resolution spectrum of the single-photon emitter (SPE) from (c). The thick red trace is the time average of the traces shown in pink. Inset: SPE spectral diffusion plot. e Second-order correlation function of the SPE. The left vertical axis denotes the as-measured \({{g}_{{{{{{\rm{raw}}}}}}}}^{\left(2\right)}\left(\tau \right)\) values, whereas the right vertical axis denotes the background-corrected \({g}^{\left(2\right)}\left(\tau \right)\) values. Fitting of the data (red curve) reveals a \({{g}_{{{{{{\rm{raw}}}}}}}}^{\left(2\right)}\left(0\right)\) of 0.13 ± 0.04, while background correction results in a \({g}^{\left(2\right)}\left(0\right)\) of \({0.01}_{-0.01}^{+0.04}\) (the details of the background correction are available in “Methods”). The black dashed line marks where \({g}^{\left(2\right)}\left(\tau \right)=0\) after background correction. f SPE intensity as a function of excitation power. The error bars represent the standard deviation from the time averaging and the red solid line is a fit to the data.
