Fig. 2: Probing retention of structural integrity by variable temperature XRD and Raman.
From: Insulator-to-metal-like transition in thin films of a biological metal-organic framework
a XRD patterns recorded on the Cu(Cys)2 thin film sample at 300, 333, 373, and back to 300 K. The pattern remained almost identical across various temperatures. b Raman spectra recorded on the Cu(Cys)2 thin film sample at 300, at 333, and back to 300 K. Characteristic vibrational features mentioned and spectral regions are highlighted. Source data are provided as a Source Data file.
