Fig. 5: Improved device stability.

a Normalized PCEs of the PM6:Y6 and PM6: TSMA-based devices under long-term annealing at 100 °C in a nitrogen-filled glovebox. b Maximum power point (MPP) stability test of the PM6:Y6 and PM6:TSMA-based devices under 1-Sun equivalent illumination from white LEDs at the MPP conditions in open-air. c Illustrations of the dependence of the morphology stability on the χ value in the χ-φSMA phase diagram. d Schematic illustration of the TSMAs and Y6 molecular distribution and diffusion process in solution and PM6:acceptor films during the device fabrication and thermal aged procedures.