Fig. 2: Dragonfly-like splay deformation due to charged defect lines.

a–d Zoom-in POM images of the area highlighted in Fig. 1c at different geometries a extinction position, b with full wave plate at 45° and c, d with the sample rotated in opposite directions. Images show a distortion of the uniform structure around spike-shaped defect lines. Crossed bidirectional white arrows indicate the direction of the polarizer and analyzer, while the green arrow indicates the orientation of the photopatterned direction. e–h Dtmm simulations for the POM geometries in (a–d), considering the structure described in (i–k). i 3D sketch of the director and polarization arrangement around a defect line in the uniformly patterned area. Here, light blue rectangles represent the cell surface glass plates. j, k The corresponding sketch in the cell surface plane (j) and in the middle of the cell plane (k), respectively. The structure twists across the cell thickness to accommodate the splay around the defect line. This splay director distortion reflects the electric charge of the defect line.