Fig. 1: Crystalline structure of the Pt3Sn samples. | Nature Communications

Fig. 1: Crystalline structure of the Pt3Sn samples.

From: Robust negative longitudinal magnetoresistance and spin–orbit torque in sputtered Pt3Sn and Pt3SnxFe1-x topological semimetal

Fig. 1

a Specular (θ−2θ scans) XRD patterns of the Pt reference, Pt3Sn and Pt3SnxFe1-x thin films. b Reciprocal space maps (RSM) around the (002) Bragg reflection of the MgO substrate of the Pt3Sn and Pt3SnxFe1−x thin films. Both the Pt reference and the Pt3Sn and Pt3SnxFe1-x thin films grow epitaxially on the MgO substrate along the (111) direction. The XRD experiments show a small amount of (001) oriented grains. c HAADF-STEM images of the Pt3Sn thin film on the MgO substrate. Low-magnification image (top panel) shows the Pt3Sn film and capping layers with relatively uniform thicknesses. Atomic-resolution HAADF-STEM images obtained from (111) oriented (bottom-left) and (002) oriented (bottom-right) grains demonstrate their crystalline orientations. Fast Fourier transforms (FFTs) from the (111) and (002) oriented grains are also displayed (bottom-middle). d Atomic-resolution HAADF-STEM image and EDX elemental maps of the Pt3SnxFe1−x. Schematic of the atomic structure is illustrated along with elemental line profiles, extracted from the region in the yellow-dashed line on the HAADF-STEM image.

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