Fig. 3: TEM analysis of the high-temperature flexural deformed B4C ceramics.

The results of the samples initially sintered respectively under the conditions of a–i high pressure and low temperature and j–l low pressure and high temperature. a Bright-field TEM micrograph. b–e HRTEM images of large-sized twins, twin boundary, nanoscaled stacking faults and twins. f–i Typical twin boundary and the corresponding strain along the horizontal (εxx), shear (εxy), and vertical (εyy) directions. j Bright-field TEM micrograph. k HRTEM images of large-sized twinning. l Bright-field TEM micrograph of large-sized twinning without nano-twins and stacking faults.