Fig. 1: Crackling noise detection based on AFM nanoindentation.
a A constant force, typically in the nN range and depending on material hardness, is applied over a long period (hours) through an AFM probe and surface movement is detected at the limit of the AFM’s sensitivity, typically in the sub-Å to pm range, depending on the specific setup. Individual nanoscale features, such as domain walls in ferroelectrics, can be selected prior by other AFM-based imaging techniques which are well-defined in our current reports17, 18. b Example of a recorded avalanche distribution under the AFM probe.
