Fig. 1: Characterization of BM-SFO thin films and the concept of oxidation of BM-SFO by in-situ TEM.
From: Guided anisotropic oxygen transport in vacancy ordered oxides
a–c Structure models (projected along [010]) of (a) BM-SFO with OVCs parallel to the substrate, (b) P-SFO, and (c) BM-SFO with OVCs perpendicular to substrate. d Structure model highlighting an OVC plane shown in (c) but viewed along [100]. e–f HAADF-STEM images of BM-SFO grown on STO(001) and LSAT(001), respectively, demonstrating the controlled orientation of OVCs. Scale bar is 2 nm. g Schematic illustrations showing the electron-beam illumination of the cross-sectional STO/SFO sample. The yellow spheres represent the positively charged surface of the specimen as a result of electron beam illumination. h Schematics of electron-beam induced electrical field (dark blue arrows) generated during TEM imaging and its effect in promoting O2- diffusion. The orange spheres represent O2- ions moving in the opposite direction of electron-beam-induced electrical field. The light brown color represents the area under electron beam illumination.
