Fig. 2: Schematic of nanodiffraction imaging.
From: Reassessing chain tilt in the lamellar crystals of polyethylene
a Schematic describing nanodiffraction imaging (NDI). b Bright-field scanning transmission electron microscopy (STEM) image of high-density PE (HDPE) acquired after NDI. The dashed square indicates the NDI scan area. c–e Indexing representative electron diffraction (ED) patterns acquired via the NDI of HDPE, which were extracted from the tips of the white triangles shown in (b). In (e), the direction of the incident electron beam is indicated by [uvw], where u, v, and w are the smallest integers with no common divisor. f ED pattern of a polycrystalline region. g Average of all the ED patterns. h ED pattern of the same sample acquired from another field of view using a 2.1-µm-diameter electron beam.
