Fig. 1: Relation between Jsc,JV and Jsc,EQE.

a Integrated external quantum efficiency, Jsc,EQE, against short circuit current from JV-measurements, Jsc,JV, for all 5575 devices found in the Perovskite Database where both values are reported. The black diagonal line represents Jsc,JV = Jsc,EQE. b Distribution of Jsc,JV/Jsc,EQE for the entire dataset. The bin size is set to 0.004.