Fig. 4: Magnetic field control of CrSBr exciton-polaritons.
From: Magnetically-dressed CrSBr exciton-polaritons in ultrastrong coupling regime
a–c The magnetic field-dependent (along the c axis) polariton reflectance spectra at normal incidence recorded at 2 K (a), 100 K (b), and 150 K (c), respectively. d–f RMCD signals of a CrSBr flake of similar thickness placed on SiO2/Si substrate as a function of the applied magnetic field measured at 2 K (d), 100 K (e), and 150 K (f), respectively. g–i Exciton energy and coupling strength g values from COM fittings using the one-exciton Lorentzian model, corresponding to the results in a–c.
