Fig. 2: Impact of PVK adhesion. | Nature Communications

Fig. 2: Impact of PVK adhesion.

From: Charge injection engineering at organic/inorganic heterointerfaces for high-efficiency and fast-response perovskite light-emitting diodes

Fig. 2

a Photos showing that PVK was dissolved in DMSO in a wide range of concentrations. b The schematic diagram showing the detailed configuration of NiOx/SAM/PVK resulted in a robust interface. c Calculated PDOS for the pristine NiOx surface (top plot), the unpassivated NiOx surface with a Ni vacancy (middle plot) and the passivated NiOx surface with the SAM (bottom plot). The black dashed line indicates the location of the Fermi level, and ‘×10’ indicates that the PDOS of the SAM molecules shown above is 10 times larger than the original PDOS to provide a clear demonstration. d, e The VBM isosurface plots of the pristine NiOx surface. f The unpassivated NiOx surface with a Ni vacancy. g The passivated surface with the SAM. h Calculated charge density difference (Δρ), amount of charge transfer (ΔQ) and electrostatic potential step (ΔΦ) at the NiOx/SAM interface. PL lifetimes (i) and PLQYs (j) of (PEA/IPA)2Csn−1PbnBr3n+1 perovskites deposited on various substrates.

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