Fig. 2: Controlled chirality in twist-stacking-produced multiple-layered architectures of aligned CNTs.
From: Engineering chirality at wafer scale with ordered carbon nanotube architectures
a CD spectra for a twisted two-layer CNT stack at twist angles of 15° (blue dashed line), 45° (red solid line), and 60° (black dashed line). b CD spectra for a twisted three-layer CNT stack with two equal twist angles, θ = 15° (blue dashed line), 30° (red solid line), and 45° (black dashed line). c CD spectra for left- (red lines) and right-handed (blue lines) twisted three-layer stacks. All twist angles in left-handed stacks are expressed as positive angles (+30°), while those in right-handed stacks are expressed as negative angles (−30°). d CD spectra for CNT architectures in the A, AB, ABA, and ABAB twist configurations. All twist angles have the same absolute value of 30°. Source data are provided as a Source Data file.
